| Title | Link | Published | Description |
|---|---|---|---|
| X-ray Powder Diffraction and Crystal Structure Prediction for Polymorph Screening and Structure Solution in Pharmaceutical Development | https://rigaku.com/resources/rigaku-journal/xrd-structure-prediction-polymorph-screening | Aug 21, 2026, 3:35:41 PM | Summer 2026 Volume 42, No. 2 - Simon Bates, R. Alex Mayo, Zhuocen Yang, Baimei Shi and Akihiro Himeda |
| TFXRD X-ray Diffraction System for Thin Films —X-ray diffractometer for large-diameter wafers and thin-film evaluation— | https://rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2042(1)%20-%20Winter%202026/Rigaku%20Journal%2042-1_32.pdf | Feb 23, 2026, 5:05:37 PM | Winter 2026 Volume 42, No. 1 |
| Microarea X-ray Diffractometer - DicifferX Microarea Edition | https://rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2042(1)%20-%20Winter%202026/Rigaku%20Journal%2042-1_36.pdf | Feb 23, 2026, 4:58:30 PM | Winter 2026 Volume 42, No. 1 |
| Total X-ray Scattering | https://rigaku.com/resources/rigaku-journal/total-xray-scattering | Feb 23, 2026, 4:58:28 PM | Winter 2026 Volume 42, No. 1 - Masatsugu Yoshimoto |
| Stress evaluation of crystalline polymers using X-ray diffractometry | https://rigaku.com/resources/rigaku-journal/stress-evaluation-crystalline-polymers | Feb 23, 2026, 4:58:26 PM | Winter 2026 Volume 42, No. 1 - Akimitsu Nezu and Takuya Kikuchi |
| AI Analysis Basic Course - Second Installment: Application of Basis Profile Decomposition to the Powder X-ray Diffraction Method | https://rigaku.com/products/x-ray-diffraction-and-scattering/xrd/learning/ai-analysis/basis-profile-decomposition | Feb 23, 2026, 4:58:24 PM | Winter 2026 Volume 42, No. 1 - Takumi Ohta |
| Quantitative Analysis of Crystalline Silica by XRD | https://rigaku.com/resources/rigaku-journal/quantitative-xrd-analysis-crystalline-silica | Aug 21, 2025, 10:18:42 AM | Summer 2025 Volume 41, No. 2 - Kaho Hamada, Miki Kasari, and Keigo Nagao |
| Powder X-ray Diffraction Basic Course - Eighth Installment: Crystallinity | https://rigaku.com/products/x-ray-diffraction-and-scattering/xrd/learning/basics/crystallinity | Aug 21, 2025, 10:18:42 AM | Summer 2025 Volume 41, No. 2 - Kasumi Kihara |
| AI Analysis Basic Course - First Installment: Neural Network Application to Phase Identification in Powder X-ray Diffraction | https://rigaku.com/products/x-ray-diffraction-and-scattering/xrd/learning/ai-analysis/neural-network-application-phaseid | Aug 21, 2025, 10:18:42 AM | Summer 2025 Volume 41, No. 2 - Toshihide Shibasaki, Takumi Ohta, and Akihiro Himeda |
| Development of a Digital Laboratory Integrating Modular Measurement Instruments | https://rigaku.com/resources/rigaku-journal/digital-laboratory-integrating-modular-instruments | Aug 21, 2025, 10:18:42 AM | Summer 2025 Volume 41, No. 2 - Akira Aiba, Kazunori Nishio, and Taro Hitosugi |
| X-ray Seamless Pixel Array Detector XSPA-200 ER High energy resolution detector for a benchtop X-ray diffractometer | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2041(1)%20-%20Winter%202025/Rigaku%20Journal%2041-1_25.pdf | Feb 21, 2025, 11:04:37 AM | Winter 2025 Volume 41, No. 1 |
| Powder X-ray Diffraction Basic Course - Seventh Installment: Lattice Constants | https://rigaku.com/products/x-ray-diffraction-and-scattering/xrd/learning/basics/lattice-constants | Aug 21, 2024, 1:43:46 PM | Summer 2024 Volume 40, No. 2 - Keigo Nagao |
| Evaluation of stable and metastable forms of acetaminophen using a combination of X-ray diffraction, thermal analysis, and electron diffraction | https://rigaku.com/resources/rigaku-journal/stable-metastable-acetaminophen-evaluation | Aug 21, 2024, 1:43:46 PM | Summer 2024 Volume 40, No. 2 - Taiji Yamamoto, Yasuaki Masuda and Hiroyasu Sato |
| Total X-ray Scattering (TXS) Plugin | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2040(1)%20-%20Winter%202024/Rigaku%20Journal%2040-1_27.pdf | Feb 20, 2024, 7:25:05 PM | Winter 2024 Volume 40, No. 1 |
| Beyond static structure <hr>X-ray solution scattering: MAXS reveals a massive movement during catalytic action of the non-phosphorylated human kinase MAP2K4 | https://rigaku.com/resources/rigaku-journal/human-kinase-massive-movement-maxs | Feb 20, 2024, 7:08:21 PM | Winter 2024 Volume 40, No. 1 - Takashi Matsumoto, Akihito Yamano, Yuka Murakawa, Harumi Fukada, Masaaki Sawa and Takayoshi Kinoshita |
| Performance Evaluation of the High Frame Rate Detector XSPA | https://rigaku.com/resources/rigaku-journal/xspa-detector-performance-evaluation | Feb 20, 2024, 7:02:23 PM | Winter 2024 Volume 40, No. 1 - Yasukazu Nakaye, Yasutaka Sakuma, Takuto Sakumura, Satoshi Mikusu and Kazuyuki Matsushita |
| GI-XRD measurements of thin film samples using a 2D detector and 2D-SAXS/WAXS attachment | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2035(1)%20-%20Winter%202019/Rigaku%20Journal%2035-1_5-8.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2019 Volume 35, No. 1 - Shintaro Kobayashi and Katsuhiko Inaba |
| SmartLab Studio II Data Visualization plugin —Analysis examples of micro area XY mapping using CBO-μ— | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2037(1)%20-%20Winter%202021/Rigaku%20Journal%2037-1_30-34.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2021 Volume 37, No. 1 |
| PDF analysis using X-ray total scattering —Theory and application examples | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2036(1)%20-%20Winter%202020/Rigaku%20Journal%2036-1_10-18.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2020, Volume 36, No. 1 - Masatsugu Yoshimoto and Yuji Shiramata |
| Characterization of lithium-ion battery materials with SmartLab | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2036(1)%20-%20Winter%202020/Rigaku%20Journal%2036-1_1-9.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2020, Volume 36, No. 1 - Yuji Shiramata and Takayuki Konya |
| Powder X-ray Diffraction Basic Course - Second installment: Selection of equipment configuration to obtain high-quality data | https://rigaku.com/products/x-ray-diffraction-and-scattering/xrd/learning/basics/equipment-configuration | Jan 26, 2024, 7:53:14 PM | Winter 2021 Volume 37, No. 1 - Masashi Omori |
| Evaluation of crystalline polymer materials using a 2D-SAXS/WAXS system | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2035(1)%20-%20Winter%202019/Rigaku%20Journal%2035-1_9-16.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2019 Volume 35, No. 1 - Yukiko Namatame and Keigo Nagao |
| High-resolution receiving optics for SmartLab X-ray diffraction system with a Hybrid Pixel Array Multi-Dimensional Detector (HyPix): HyRES220, HyRES400 | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2037(1)%20-%20Winter%202021/Rigaku%20Journal%2037-1_26-29.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2021 Volume 37, No. 1 |
| Powder X-ray Diffraction Basic Course - Fourth Installment: Qualitative analysis | https://rigaku.com/products/x-ray-diffraction-and-scattering/xrd/learning/basics/qualitative-analysis | Jan 26, 2024, 7:53:14 PM | Winter 2022 Volume 38, No. 1 - Miki Kasari |
| Cement analysis by X-ray diffractometry | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2036(1)%20-%20Winter%202020/Rigaku%20Journal%2036-1_19-25.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2020, Volume 36, No. 1 - Atsushi Ohbuchi and Takahiro Kuzumaki |
| Wide-Angle X-ray Scattering Instrument NANOPIX-WE | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2038(1)%20-%20Winter%202022/Rigaku%20Journal%2038-1_22-26.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2022 Volume 38, No. 1 |
| Portable stress analyzer SmartSite RS | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2031(1)%20-%20Winter%202015/RigakuJournal31-1_31-33.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2015 Volume 31, No. 1 |
| High-speed 1D silicon strip X-ray detector D/teX Ultra 250 | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2030(1)%20-%20Winter%202014/RigakuJournal30-1_35-38.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2014 Volume 30, No. 1 |
| Micro-area X-ray diffraction measurement by SmartLab μHR diffractometer system with ultra-high brilliance microfocus X-ray optics and two-dimensional detector HyPix-3000 | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2032(1)%20-%20Winter%202016/Rigaku%20Journal%2032-1_3-9.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2016 Vol.32 No.1 - Yuji Shiramata |
| A new method for quantitative phase analysis: Direct derivation of weight fractions from observed intensities and chemical composition data of individual crystalline phases | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2034(1)%20-%20Winter%202018/Rigaku%20Journal%2034-1_3-8.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2018, Volume 34, No. 1 - Hideo Toraya |
| Benchtop X-ray diffractometer enabling use with HyPix-400 MF two-dimensional detector | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2034(1)%20-%20Winter%202018/Rigaku%20Journal%2034-1_30-31.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2018, Volume 34, No. 1 |
| Applications of the two-dimensional detector HyPix-3000 in X-ray diffractometry | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2031(1)%20-%20Winter%202015/RigakuJournal31-1_4-9.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2015 Volume 31, No. 1 - Atsushi Ohbuchi |
| Introduction to XRD analysis of modern functional thin films using a 2-dimensional detector —(2) Analysis of epitaxial films | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2033(1)%20-%20Winter%202017/Rigaku%20Journal%2033-1_10-14.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2017 Volume 33, No. 1 - Katsuhiko Inaba |
| The Nobel prize in physics 2014 | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2031(1)%20-%20Winter%202015/RigakuJournal31-1_1-3.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2015 Volume 31, No. 1 - Katsuhiko Inaba |
| Graphite/graphene analytical index calculator - GG Index | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2035(1)%20-%20Winter%202019/Rigaku%20Journal%2035-1_38-40.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2019 Volume 35, No. 1 |
| Principles and applications of multilayer mirror optics for X-ray diffraction measurements —CBO series for SmartLab | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2033(1)%20-%20Winter%202017/Rigaku%20Journal%2033-1_15-19.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2017 Volume 33, No. 1 - Takeshi Osakabe |
| Use of multi-dimensional measurement in powder X-ray diffraction | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2034(1)%20-%20Winter%202018/Rigaku%20Journal%2034-1_9-13.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2018, Volume 34, No. 1 - Yukiko Namatame, Takahiro Kuzumaki, Yuji Shiramata and Keigo Nagao |
| Characterization in lithium ion battery | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2028(1)%20-%20Winter%202012/RJ28-1_1-4s.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2012, Volume 28, No. 1 - Hikari Takahara |
| Integrated platform SmartStudio | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2029(1)%20-%20Winter%202013/RJ29-1_38-39.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2013, Volume 29, No. 1 |
| Detailed observations of dynamic changes such as phase transitions, melting and crystallization using an XRD-DSC with a high-speed, high-sensitivity two-dimensional PILATUS detector | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2027(1)%20-%20Winter%202011/RJ27-1_9-14.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2011, Volume 27, No. 1 - Akira Kishi |
| High resolution spiral analyzer CALSA | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2026(1)%20-%20Winter%202010/RJ26-1_21-22.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2010, Volume 26, No. 1 |
| Integrated X-ray powder diffraction software PDXL | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2026(1)%20-%20Winter%202010/RJ26-1_23-27.pdf.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2010, Volume 26, No. 1 |
| General features of GaN-related materials | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2030(1)%20-%20Winter%202014/RigakuJournal30-1_1-6.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2014 Volume 30, No. 1 - Katsuhiko Inaba |
| X-ray thin-film measurement techniques II. Out-of-plane diffraction measurements | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2025(1)%20-%20Winter%202009/RJ25-1_7-12.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2009, Volume 25, No. 1 - Toru Mitsunaga |
| X-ray thin-film measurement techniques VIII. Detectors and series summary | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2028(1)%20-%20Winter%202012/RJ28-1_8-13s.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2012, Volume 28, No. 1 - Shintaro Kobayashi and Katsuhiko Inaba |
| X-ray thin-film measurement techniques IV. In-plane XRD measurements | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2026(1)%20-%20Winter%202010/RJ26-1_3-11.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2010, Volume 26, No. 1 - Shintaro Kobayashi |
| Benchtop X-ray diffractometer MiniFlex II + D/teX Ultra | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2027(1)%20-%20Winter%202011/RJ27-1_20.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2011, Volume 27, No. 1 |
| Characterization of GaN-related materials using high-resolution XRD | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2030(1)%20-%20Winter%202014/RigakuJournal30-1_7-16.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2014 Volume 30, No. 1 - Katsuhiko Inaba |
| SmartLab™ Automatic X-Ray Diffractometer | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2023%20-%20May%202006/23_52.pdf | Jan 26, 2024, 7:53:14 PM | Volume 23, 2006 |
| Making high speed, high resolution measurements using MiniFlex II + D/teX Ultra | https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2027(1)%20-%20Winter%202011/RJ27-1_6-8.pdf | Jan 26, 2024, 7:53:14 PM | Winter 2011, Volume 27, No. 1 - Yukiko Namatame |
All Products
Explore all Rigaku products
Product Finder
Find the best product for your needs
Request Information
Request product information
Semiconductor Metrology Tools
X-ray metrology solutions from lab to fab
Crystallography
X-ray and electron diffraction for crystallography
X-ray Diffraction & Scattering
X-ray diffractometers for crystalline materials analysis
XRF Spectrometers
X-ray fluorescence spectrometers for elemental analysis
Imaging & Non-destructive Testing
Computed tomography and radiography systems for X-ray imaging
Thermal Analysis
Thermal and evolved gas analysis instruments for materials characterization
Handheld Raman
Handheld Raman spectrometers for materials identification
Components
X-ray sources, detectors, optics, magnetic fluid feedthroughs, and high-voltage supplies
Process Control
In-line monitoring systems
Semiconductor Metrology Tools
X-ray metrology solutions from lab to fab
WDXRF
Flexible elemental analysis for thin films
XRR, EDXRF & Optical
X-ray and hybrid metrology solutions for blanket and patterned wafers
TXRF
Wafer surface contamination metrology
HRXRD
X-ray metrology for epitaxial films
XRT
Non-destructive dislocation imaging
XRD
X-ray diffraction for crystallographic orientation of wafers and ingots
CDSAXS
X-ray critical dimension metrology
X-ray Diffraction & Scattering
X-ray diffraction and scattering analyses for atomic level materials characterization
XRD
X-ray diffractometers for polycrystalline materials characterization
SAXS
Small angle X-ray scattering for nanoscale size, shape, and morphology analyses
Stress Analysis
X-ray diffractometers for non-destructive residual stress analysis
XRF Spectrometers
X-ray fluorescence spectrometers for elemental analysis
EDXRF
Energy dispersive X-ray fluorescence spectrometers for elemental analysis
WDXRF
Wavelength dispersive X-ray fluorescence spectrometers for elemental analysis
Micro-XRF
Focuses X-rays onto a microscopic area to locally analyze elemental composition
TXRF
Total reflection X-ray fluorescence spectrometers for surface and trace phase analysis
Imaging & Non-destructive Testing
Non-destructive imaging analysis by X-rays
X-ray Computed Tomography
Research grade industrial X-ray computed tomography for non-destructive 3D imaging
NDT Products
Radiography instruments for non-destructive testing
Molecular Imaging
Multimodal molecular imaging systems for pre-clinical studies
All thermal analysis equipment
Thermal analysis equipment for elucidating the thermal behavior of materials
DSC
Devices that detect changes in thermal energy that occur within a sample when it is heated or cooled
STA (TG-DSC)
Material analysis equipment that detects mass changes and thermal energy changes occurring with a sample
TMA
Analytical devices that detect changes in the shape of a sample when the sample is heated or cooled
Evolved Gas Analysis
Evolved gas analysis instruments for materials characterization
Other thermal analysis equipment
Other thermal analysis attachments
Software
Measurement and analysis software for thermal analysis and evolved gas
Components
X-ray sources, detectors, optics, magnetic fluid feedthroughs, and high-voltage supplies
X-ray sources
High-brilliance X-ray sources
Optics
X-ray and ultraviolet multilayer and crystalline optics
Detectors
Research-grade X-ray detectors
Magnetic Fluid Feedthroughs
Magnetic fluid feedthrough components
Miniature X-ray sources and high-voltage systems
Enabling small and powerful portable and handheld systems
All Industries
Overview of all industries we serve
Nanotechnology & Materials Sciences
Structure analysis from atomic to micron scale
Semiconductor & Electronic Devices
Metrology tools from lab to fab
Biotechnology & Life Sciences
Atomic, nano- to micron-scale organic materials characterization
Environment & Energy
Mineralogical and elemental analysis for industrial and environmental needs
Construction
Mineralogical and elemental analysis for construction materials
Safety & Security
Tools for chemical threat identification and forensics
Academic Research
Analytical instruments for teaching and synchrotron beamline components
Nanotechnology & Materials Sciences
Structure analysis from atomic to micron scale
Materials Science Research
Crystalline structure, nanoscale morphology, and elemental analyses for materials science
Nanotechnology
Atomic to nanoscale materials characterization for nanotechnology research
Advanced & New Materials
State-of-the-art analysis techniques developed for advanced and new materials research
Chemistry
A wide range of analysis tools for solutions to study liquids, powders, solids, films, or single crystals
Coatings & Thin films
Elemental, crystallographic, and structural characterization tools for coatings and thin films
Metals & Alloys
Elemental, crystalline phase, and texture analysis for metals and alloys
Polymers, Plastics
Analysis tools for additive concentration, percent crystallinity calculation, and advanced materials characterization
Composites
High-resolution 3D imaging for characterization of fillers, fibers, pores, and cracks in composites
Ceramics
Crystalline phase and elemental analyses for ceramics characterization
Biotechnology & Life Sciences
Atomic, nano- to micron-scale organic materials characterization
Pharmaceuticals
Crystalline structure and elemental analyses from drug discovery to process control
Life Science Researches
Protein and small molecule crystallography and various imaging instruments for life science research
Biotechnology
Crystalline structure, nanoscale structure, and elemental analyses for engineered biological materials
Food & Food Ingredients
Elemental analysis and foreign object screening for food and food ingredients safety
Cosmetics
Crystalline structure and elemental analyses for R&D, QC, and materials identification for anti-counterfeit prevention
Environment & Energy
Mineralogical and elemental analysis for industrial and environmental needs
Batteries
Crystalline structure characterization of electrode for R&D and non-destructive imaging for failure analysis
Mining & Refining
Elemental and mineralogical analysis for every stage of R&D and process control
Environment & Pollution
Heavy metal analysis for contamination monitoring and recycling materials classification
Geology & Minerals
Mineralogical and elemental analysis for in-depth study of geological specimens, and natural and artificial minerals
Petroleum & Petrochemicals
Mineralogical and elemental analysis for exploration, production, and distribution process
Photovoltaics
Crystalline and elemental analysis for thin-film photovoltaic materials
All Resources
Educational events, articles, publications, and other resources
Events & Webinars Calendar
Upcoming events and webinars
Newsletters
Rigaku newsletters for materials science, crystallography, X-ray CT, and semiconductor metrology
Technique Library
Learn more about techniques for your analysis needs
Application Library
Find application examples in your field
Rigaku Journal
Browse and search Rigaku Journal articles
Blogs
Browse Rigaku blogs
On-demand Webinars
Watch on-demand webinars to learn new techniques and industry trends
Publication Library
See how our products are used in published journal articles
eBooks
Download industry-related application eBooks
Rigaku Oxford Diffraction Forum
Find discussions about software, general crystallography issues and more
About Us
See an overview of company information
Contact Us
Contact us by email or via form
Find a Distributor
Find a Rigaku distributor in your area
Rigaku Divisions
Our business divisions and their locations
News & Press Releases
Browse Rigaku news and press releases
About Rigaku
Who we are and our history
Careers
Find jobs at Rigaku
Sustainability
Rigaku is working to make a better and more sustainable world
Products
Industries
Resources
Service & Support
About Us
Semiconductor Metrology Tools
Crystallography
X-ray Diffraction & Scattering
XRF Spectrometers
Imaging & Non-destructive Testing
Thermal Analysis
Components
Nanotechnology & Materials Sciences
Semiconductor & Electronic Devices
Biotechnology & Life Sciences
Environment & Energy
Construction
Safety & Security
Academic Research