Title	Link	Published	Description
TFXRD X-ray Diffraction System for Thin Films —X-ray diffractometer for large-diameter wafers and thin-film evaluation—	https://rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2042(1)%20-%20Winter%202026/Rigaku%20Journal%2042-1_32.pdf	Feb 23, 2026, 5:05:37 PM	Winter 2026 Volume 42, No. 1
Small-angle X-ray scattering shape metrology for 3D semiconductor devices	https://rigaku.com/resources/rigaku-journal/saxs-shape-metrology-semiconductor-devices	Feb 21, 2025, 11:04:37 AM	Winter 2025 Volume 41, No. 1 - Takumi Goto
Evaluation of MEMS device materials by X-ray fluorescence spectrometers for thin films	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2036(1)%20-%20Winter%202020/Rigaku%20Journal%2036-1_28-32.pdf	Jan 26, 2024, 7:53:14 PM	Winter 2020, Volume 36, No. 1 - Yu Aoki
Trace elemental analyses of beverages and biological materials by TXRF spectrometry	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2035(1)%20-%20Winter%202019/Rigaku%20Journal%2035-1_30-34.pdf	Jan 26, 2024, 7:53:14 PM	Winter 2019 Volume 35, No. 1 - Atsushi Ohbuchi and Hikari Takahara
Automated dislocation evaluation software for X-ray topography images: Topography Analysis	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2032(1)%20-%20Winter%202016/Rigaku%20Journal%2032-1_33-35.pdf	Jan 26, 2024, 7:53:14 PM	Winter 2016 Vol.32 No.1
The Nobel prize in physics 2014	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2031(1)%20-%20Winter%202015/RigakuJournal31-1_1-3.pdf	Jan 26, 2024, 7:53:14 PM	Winter 2015 Volume 31, No. 1 - Katsuhiko Inaba
High-throughput, high-resolution X-ray topography imaging system: XRTmicron	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2030(1)%20-%20Winter%202014/RigakuJournal30-1_30-32.pdf	Jan 26, 2024, 7:53:14 PM	Winter 2014 Volume 30, No. 1
Benchtop total reflection XRF spectrometer	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2032(1)%20-%20Winter%202016/Rigaku%20Journal%2032-1_30-32.pdf	Jan 26, 2024, 7:53:14 PM	Winter 2016 Vol.32 No.1
Crystal defects in SiC wafers and a new X-ray topography system	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2029(1)%20-%20Winter%202013/RJ29-1_1-8.pdf	Jan 26, 2024, 7:53:14 PM	Winter 2013, Volume 29, No. 1 - Kazuhiko Omote
Total reflection X-ray fluorescence spectrometer TXRF 3800e	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2028(1)%20-%20Winter%202012/RJ28-1_27-28s.pdf	Jan 26, 2024, 7:53:14 PM	Winter 2012, Volume 28, No. 1
General features of GaN-related materials	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2030(1)%20-%20Winter%202014/RigakuJournal30-1_1-6.pdf	Jan 26, 2024, 7:53:14 PM	Winter 2014 Volume 30, No. 1 - Katsuhiko Inaba
Characterization of GaN-related materials using high-resolution XRD	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2030(1)%20-%20Winter%202014/RigakuJournal30-1_7-16.pdf	Jan 26, 2024, 7:53:14 PM	Winter 2014 Volume 30, No. 1 - Katsuhiko Inaba
Evaluation of contamination of power semiconductor device wafers by total reflection X-ray fluorescence spectrometer	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2029(1)%20-%20Winter%202013/RJ29-1_9-14.pdf	Jan 26, 2024, 7:53:14 PM	Winter 2013, Volume 29, No. 1 - Hiroshi Kohno
Non-destructive Characterization of Crystallographic Defects of SiC Substrates using X-ray Topography for R&D and Quality Assurance in Production	https://rigaku.com/resources/rigaku-journal/sic-substrate-characterization-using-xray-topography	Jan 26, 2024, 7:53:14 PM	Summer 2021 Volume 37, No. 2 - Christian Reimann and Christian Kranert
Defect Structure Analysis in Single Crystal Substrates using XRTmicron	https://rigaku.com/resources/rigaku-journal/single-crystal-substrate-defect-analysis-using-xrtmicron	Jan 26, 2024, 7:53:14 PM	Summer 2020, Volume 36, No. 2 - Katsuhiko Inaba
Machine Learning and Application to Spectral Analysis on TXRF Spectrometry	https://rigaku.com/resources/rigaku-journal/machine-learning-application-txrf-spectrometry	Jan 26, 2024, 7:53:14 PM	Summer 2021 Volume 37, No. 2 - Makoto Doi and Shinya Kikuta
Development of innovative organic semiconductors driven by state-of-art analytical instruments	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2034(2)%20-%20Summer%202018/RigakuJournal34-2_1-9.pdf	Jan 26, 2024, 7:53:14 PM	Summer 2018, Volume 34, No. 2 - Toshihiro Okamoto
Liquid analysis by total reflection X-ray fluorescence spectrometer	https://resources.rigaku.com/hubfs/2024%20Rigaku%20Global%20Site/Resource%20Hub/Knowledge%20Library/Rigaku%20Journals/Volume%2032(2)%20-%20Summer%202016/Rigaku%20Journal%2032-2_17-18.pdf	Jan 26, 2024, 7:53:14 PM	Summer 2016 Volume 33, No. 2 - Kazuaki Okuda
Dramatic Improvement in the Throughput of X-ray Topography	https://rigaku.com/resources/rigaku-journal/dramatic-improvement-xray-topography-throughput	Nov 28, 2023, 10:26:02 PM	Summer 2023 Volume 39, No. 2 - Kenta Shimamoto