USC CT Seminar
Wednesday, September 27, 2023 Hosted by the Department of Earth Sciences at the University of Southern California
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Semiconductor Metrology Tools
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Crystallography
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X-ray Diffraction & Scattering
X-ray diffractometers for crystalline materials analysis
XRF Spectrometers
X-ray fluorescence spectrometers for elemental analysis
Imaging & Non-destructive Testing
Computed tomography and radiography systems for X-ray imaging
Thermal Analysis
Thermal and evolved gas analysis instruments for materials characterization
Handheld Raman
Handheld Raman spectrometers for materials identification
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X-ray generators, detectors, optics, and other components
Process Control
In-line monitoring systems
Semiconductor Metrology Tools
X-ray metrology solutions from lab to fab
WDXRF
Flexible elemental analysis for thin films
XRR, EDXRF & Optical
X-ray and hybrid metrology solutions for blanket and patterned wafers
TXRF
Wafer surface contamination metrology
HRXRD
X-ray metrology for epitaxial films
XRT
Non-destructive dislocation imaging
XRD
X-ray diffraction for crystallographic orientation of wafers and ingots
CDSAXS
X-ray critical dimension metrology
Crystallography
X-ray and electron diffractometers and consumables for crystallography
X-ray Diffraction
X-ray diffractometers for protein and small molecule crystallography
Electron Diffraction
Electron diffractometer for protein and small molecule crystallography
Reagents
Formulations and other consumables for protein crystallization
X-ray Diffraction & Scattering
X-ray diffraction and scattering analyses for atomic level materials characterization
XRD
X-ray diffractometers for polycrystalline materials characterization
SAXS
Small angle X-ray scattering for nanoscale size, shape, and morphology analyses
Stress Analysis
X-ray diffractometers for non-destructive residual stress analysis
XRF Spectrometers
X-ray fluorescence spectrometers for elemental analysis
EDXRF
Energy dispersive X-ray fluorescence spectrometers for elemental analysis
WDXRF
Wavelength dispersive X-ray fluorescence spectrometers for elemental analysis
TXRF
Total reflection X-ray fluorescence spectrometers for surface and trace phase analysis
Imaging & Non-destructive Testing
Non-destructive imaging analysis by X-rays
X-ray Computed Tomography
Research grade industrial X-ray computed tomography for non-destructive 3D imaging
NDT Products
Radiography instruments for non-destructive testing
Molecular Imaging
Multimodal molecular imaging systems for pre-clinical studies
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DSC
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STA (TG-DSC)
Material analysis equipment that detects weight changes and thermal energy changes occurring with a sample
TMA
Analytical devices that detect changes in the shape of a sample when the sample is heated or cooled
Evolved Gas Analysis
Evolved gas analysis instruments for materials characterization
Other thermal analysis equipment
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Biotechnology & Life Sciences
Atomic, nano- to micron-scale organic materials characterization
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Crystalline structure and elemental analyses from drug discovery to process control
Life Science Researches
Protein and small molecule crystallography and various imaging instruments for life science research
Biotechnology
Crystalline structure, nanoscale structure, and elemental analyses for engineered biological materials
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Elemental analysis and foreign object screening for food and food ingredients safety
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Environment & Energy
Mineralogical and elemental analysis for industrial and environmental needs
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Crystalline structure characterization of electrode for R&D and non-destructive imaging for failure analysis
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